These Planar diffused photodiodes are designed for either photoconductive (low capacitance, high speed applications) or photovoltaic operation (low noise, DC applications). (read more)

The TSL1401CS linear photodiode sensor array consists of a 128x1 array of photodiodes, associated charge amplifier circuitry, and a pixel data-hold function that provides simultaneous-integration start and stop times for all pixels. (read more)

The TSL3301 is a high-sensitivity linear photodiode array with a pixel density of 300 dpi (pixels-per-inch). The device has a built-in 8-bit ADC with a 3-wire serial interface. The array consists of 102 pixels, each measuring 85um high by 77um wide and spaced on 85um centers. (read more)

The Photopic Filtrode Photodiode chip was designed to mimic the response of the human eye. The part is a standard Blue- Enhanced photodiode that has a filter applied to it using an API patented process. As this process is done at the wafer level, almost any size or shape of photodiode can be filtered in this fashion. (read more)

Moxtek Si-PIN x-ray detectors are small, efficient, and reliable. Moxtek detectors are used in XRF and XRD instruments for a variety of applications and are manufactured to meet demanding customer packaging and performance requirements (read more)

Hamamatsu Corporation has introduced the G8931-20, an InGaAs avalanche photodiode with a large, 0.2 mm diameter active area and high-speed response of 0.9 GHz. The device is suitable for applications such as distance measurement, spatial light transmission, low-light-level detection, and optical time-domain reflectometry (OTDR). (read more)

The new S9345 Si PIN dual-element photodiode has been developed to optimize reflection-mode optical switches. Using the triangulation method the S9345 can be used for near-far detection. (read more)

The PerkinElmer L-series of monolithic self-scanning linear photodiode arrays offers a high-quality, low-cost solution for spectroscopy and colorimetry applications in the 300-1000nm range. The combination of high sensitivity, low dark current, low switching noise, and high saturation charge of the L-series provides excellent dynamic range and great flexibility in setting integration time. (read more)

Optimized for 1064 nm - Quadrant arrays and single active areas available. (read more)

Open Pin Scan is SPEA's set of vectorless test techniques for detecting open pins and many more process faults on PCBs in a easy and fast way, without powering the board. (read more)